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[n]	C. Hall, K. Brown, J. Edelen, and V. Schoefer, “Simulation of the ion profile monitors in the Brookhaven AGS”, in Proc. IPAC'25, Taipei, Taiwan, Jun. 2025, pp. 782-784. doi:10.18429/JACoW-IPAC2025-MOPS082
[n]	N. Majernik et al., “Foiled Again: Solid-State Sample Delivery for High Repetition Rate XFELs”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 2899-2902. doi:10.18429/JACoW-IPAC2022-THPOTK053

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