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[n]	A. Gresele, M. Giaretta, A. Visentin, A. A. Sulimov, and J. H. Thie, “The Statistics of Industrial XFEL Cavities Fabrication at E.ZANON”, in Proc. SRF'13, Paris, France, Sep. 2013, paper MOP034, pp. 180-182. 
[n]	K. Tian et al., “Commissioning of the Lower Emittance Lattice at SPEAR3”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 1502-1505. doi:10.18429/JACoW-IPAC2022-TUPOMS036

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