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[n]	Y. Sakagawa et al., “Single Event Simulation for Memories Using Accelerated Ions”, in Proc. Cyclotrons'86, Tokyo, Japan, Oct. 1986, paper K-15, pp. 650-653. 
[n]	N. R. Neveu et al., “Bunch Length Measurements Using CTR at the AWA with Comparison to Simulation”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 4166-4168. doi:10.18429/JACoW-IPAC2018-THPMF048

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