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[n]	J. J. Petillo, K. Jensen, B. Levush, and J. N. P. Panagos, “Detailed Photoemission Modeling Using the 3D Finite-Element PIC Code MICHELLE”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper TUODC01, pp. 904-904. 
[n]	P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, “System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095-3097. 
[n]	V. Miltchev et al., “Measurements of Thermal Emittance for Cesium Telluride Photocathodes at PITZ”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper THPP042, pp. XX-XX. 
[n]	B. Kehrer et al., “Filling Pattern Measurements Using Dead-Time Corrected Single Photon Counting”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 2219-2222. doi:10.18429/JACoW-IPAC2018-WEPAL027

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