[n] J. Dietrich, “Invited Paper: Recent Beam Diagnostic Techniques”, in Proc. Cyclotrons'95, Cape Town, South Africa, Oct. 1995, paper E-06, pp. 186-193.
[n] R. Kumar and S. J. Vala, “Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source”, presented at the ECRIS'22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished.
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