Favourites
For Word
[n] B. Schmidt, “Overview on Diagnostics for X- and XUV-FELs”, in Proc. FEL'06, Berlin, Germany, Aug.-Sep. 2006, paper THCAU01, pp. 761-768.
[n] Z. L. Thune, N. Fleming, C. McKinney, E. M. Nicometo, T. R. Bieler, and S. Balachandran, “Ex-Situ Investigation of the Effects of Heating Rate on the Recrystallization in Rolled Polycrystals of High-Purity Niobium”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 1. doi:10.18429/JACoW-SRF2021-SUPCAV002
For LaTeX
Use Complete Form
For BibTeX
References
- B. Schmidt, “Overview on Diagnostics for X- and XUV-FELs”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THCAU01, pp. 761-768.
- Z. L. Thune, N. Fleming, C. McKinney, E. M. Nicometo, T. R. Bieler, and S. Balachandran, “Ex-Situ Investigation of the Effects of Heating Rate on the Recrystallization in Rolled Polycrystals of High-Purity Niobium”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 1.
Back to search