[n] D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. 20th Int. Conf. RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. doi:10.18429/JACoW-SRF2021-SUPFDV016
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Paper Title: A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate
Paper URL: https://jacow.org/srf2021/papers/SUPFDV016.pdf
Conference: 20th Int. Conf. RF Superconductivity (SRF'21)
Paper ID: SUPFDV016
Location in proceedings: 100
Original Author String: D.J. Seal, G. Burt, B.S. Sian, P. Goudket, O.B. Malyshev, R. Valizadeh, J.A. Conlon