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[n]	A. Veeramani, E. Bjorklund, and T. F. Debelle, “Using EPICS Enabled Industrial Hardware for Upgrading Control Systems”, in Proc. ICALEPCS'09, Kobe, Japan, Oct. 2009, paper WEP078, pp. 555-557. 

[n]	Ye. Ivanisenko, V. Schlott, and P. Peier, “Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP082, pp. 922-924. 

[n]	T. Obina and Y. Yano, “Optical-Fiber Beam Loss Monitor for the KEK Photon Factory”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPA10, pp. 351-354. 

[n]	I. Hsu, C. I. Yu, and C. C. Chu, “Study of Fast Electron Beam Profile Monitor System”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper MPQ26, pp. 2515-2517. 

For LaTeX

%\cite{Veeramani:ICALEPCS09-WEP078} \bibitem{Veeramani:ICALEPCS09-WEP078} A. Veeramani, E. Bjorklund, and T. F. Debelle, \textquotedblleft{Using EPICS Enabled Industrial Hardware for Upgrading Control Systems}\textquotedblright, in \emph{Proc. ICALEPCS’09}, Kobe, Japan, Oct. 2009, paper WEP078, pp. 555--557. %\cite{Ivanisenko:FEL14-THP082} \bibitem{Ivanisenko:FEL14-THP082} Ye. Ivanisenko, V. Schlott, and P. Peier, \textquotedblleft{Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF}\textquotedblright, in \emph{Proc. FEL’14}, Basel, Switzerland, Aug. 2014, paper THP082, pp. 922--924. %\cite{Obina:IBIC12-TUPA10} \bibitem{Obina:IBIC12-TUPA10} T. Obina and Y. Yano, \textquotedblleft{Optical-Fiber Beam Loss Monitor for the KEK Photon Factory}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper TUPA10, pp. 351--354. %\cite{Hsu:PAC95-MPQ26} \bibitem{Hsu:PAC95-MPQ26} I. Hsu, C. I. Yu, and C. C. Chu, \textquotedblleft{Study of Fast Electron Beam Profile Monitor System}\textquotedblright, in \emph{Proc. PAC’95}, Dallas, TX, USA, May 1995, paper MPQ26, pp. 2515--2517.

For BibTeX

@inproceedings{veeramani:icalepcs09-wep078, author = {A. Veeramani and E. Bjorklund and T. F. Debelle}, title = {{Using EPICS Enabled Industrial Hardware for Upgrading Control Systems}}, booktitle = {Proc. ICALEPCS'09}, pages = {555--557}, paper = {WEP078}, venue = {Kobe, Japan, Oct. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/icalepcs2009/papers/WEP078.pdf}, language = {english} } @inproceedings{ivanisenko:fel14-thp082, author = {Ye. Ivanisenko and V. Schlott and P. Peier}, title = {{Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF}}, booktitle = {Proc. FEL'14}, pages = {922--924}, paper = {THP082}, venue = {Basel, Switzerland, Aug. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2014/papers/THP082.pdf}, language = {english} } @inproceedings{obina:ibic12-tupa10, author = {T. Obina and Y. Yano}, title = {{Optical-Fiber Beam Loss Monitor for the KEK Photon Factory}}, booktitle = {Proc. IBIC'12}, pages = {351--354}, paper = {TUPA10}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/TUPA10.pdf}, language = {english} } @inproceedings{hsu:pac95-mpq26, author = {I. Hsu and C. I. Yu and C. C. Chu}, title = {{Study of Fast Electron Beam Profile Monitor System}}, booktitle = {Proc. PAC'95}, pages = {2515--2517}, paper = {MPQ26}, venue = {Dallas, TX, USA, May 1995}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} }

References

• A. Veeramani, E. Bjorklund, and T. F. Debelle, “Using EPICS Enabled Industrial Hardware for Upgrading Control Systems”, in Proc. 12th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'09), Kobe, Japan, Oct. 2009, paper WEP078, pp. 555-557.
• Ye. Ivanisenko, V. Schlott, and P. Peier, “Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP082, pp. 922-924.
• T. Obina and Y. Yano, “Optical-Fiber Beam Loss Monitor for the KEK Photon Factory”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA10, pp. 351-354.
• I. Hsu, C. I. Yu, and C. C. Chu, “Study of Fast Electron Beam Profile Monitor System”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper MPQ26, pp. 2515-2517.