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[n]	A. Veeramani, E. Bjorklund, and T. F. Debelle, “Using EPICS Enabled Industrial Hardware for Upgrading Control Systems”, in Proc. ICALEPCS'09, Kobe, Japan, Oct. 2009, paper WEP078, pp. 555-557. 
[n]	Ye. Ivanisenko, V. Schlott, and P. Peier, “Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP082, pp. 922-924. 
[n]	T. Obina and Y. Yano, “Optical-Fiber Beam Loss Monitor for the KEK Photon Factory”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPA10, pp. 351-354. 
[n]	I. Hsu, C. I. Yu, and C. C. Chu, “Study of Fast Electron Beam Profile Monitor System”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper MPQ26, pp. 2515-2517. 

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