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[n]	H. Ito et al., “Lower Critical Field Measurement System of Thin Film Superconductor”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 3882-3884. doi:10.18429/JACoW-IPAC2018-THPAL105
[n]	H. Ito et al., “Lower Critical Field Measurement of Thin Film Superconductor”, in Proc. LINAC'18, Beijing, China, Sep. 2018, pp. 484-487. doi:10.18429/JACoW-LINAC2018-TUPO066
[n]	J. Zhang et al., “Temporal Characterization of Electron Bunches From Self-Injection and Ionization Injection in a Laser Wakefield Accelerator”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 3693-3696. doi:10.18429/JACoW-IPAC2019-THPGW048
[n]	M. R. Hadmack and E. B. Szarmes, “Scanning Wire Beam Position Monitor for Alignment of a High Brightness Inverse-Compton X-ray Source”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEPF21, pp. 856-859. 

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