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[n]	M. Masaki, Y. Shimosaki, S. Takano, and M. Takao, “Novel Emittance Diagnostics for Diffraction Limited Light Sources Based on X-ray Fresnel Diffractometry”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper TUCZB1, pp. 274-278. 

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