[n] F. Roncarolo et al., “Fast Spill Monitor Studies for the SPS Fixed Target Beams”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 522-526. doi:10.18429/JACoW-IBIC2022-WE3C3
[n] C. Andre, P. Forck, R. Haseitl, A. Reiter, R. Singh, and B. Walasek-Hoehne, “Optimization of Beam Induced Fluorescence Monitors for Profile Measurements of High Current Heavy Ion Beams at GSI”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper TUPD05, pp. 412-416.
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