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[n]	F. Ji et al., “Updates on scientific and R&D highlights at SLAC MeV-UED facility”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 1146-1150. doi:10.18429/JACoW-NAPAC2025-THP094

[n]	W. Blokland and M. Schram, “Machine learning for improved accelerator and target reliability”, presented at the IPAC'24, Nashville, TN, USA, May 2024, paper THXD1, unpublished. 

[n]	V. Guo, A. Marinelli, D. Cesar, J. Bloechl, M. Kling, and S. OTool, “Micro-fabricated photoconductive sampling devices for electron beam field measurements”, presented at the NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP060, unpublished. 

[n]	A. K?ñllberg et al., “Instrumentation in DESIREE”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 131-133. doi:10.18429/JACoW-IBIC2015-MOPB040

For LaTeX

%\cite{Ji:NAPAC25-THP094} \bibitem{Ji:NAPAC25-THP094} F. Ji \emph{et al.}, \textquotedblleft{Updates on scientific and R&D highlights at SLAC MeV-UED facility}\textquotedblright, in \emph{Proc. NAPAC’25}, Sacramento, California, USA, Aug. 2025, pp. 1146--1150. \doi{10.18429/JACoW-NAPAC2025-THP094} %\cite{Blokl:IPAC24-THXD1} \bibitem{Blokl:IPAC24-THXD1} W. Blokland and M. Schram, \textquotedblleft{Machine learning for improved accelerator and target reliability}\textquotedblright, presented at the IPAC’24, Nashville, TN, USA, May 2024, paper THXD1, unpublished. %\cite{Guo:NAPAC25-MOP060} \bibitem{Guo:NAPAC25-MOP060} V. Guo, A. Marinelli, D. Cesar, J. Bloechl, M. Kling, and S. OTool, \textquotedblleft{Micro-fabricated photoconductive sampling devices for electron beam field measurements}\textquotedblright, presented at the NAPAC’25, Sacramento, California, USA, Aug. 2025, paper MOP060, unpublished. %\cite{K?ñllberg:IBIC15-MOPB040} \bibitem{K?ñllberg:IBIC15-MOPB040} A. K?ñllberg \emph{et al.}, \textquotedblleft{Instrumentation in DESIREE}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 131--133. \doi{10.18429/JACoW-IBIC2015-MOPB040}

For BibTeX

@inproceedings{ji:napac25-thp094, author = {F. Ji and others}, title = {{Updates on scientific and R&D highlights at SLAC MeV-UED facility}}, booktitle = {Proc. NAPAC'25}, pages = {1146--1150}, paper = {THP094}, venue = {Sacramento, California, USA}, series = {North American Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-7000}, isbn = {978-3-95-450261-5}, doi = {10.18429/JACoW-NAPAC2025-THP094}, language = {english} } @unpublished{blokl:ipac24-thxd1, author = {W. Blokland and M. Schram}, title = {{Machine learning for improved accelerator and target reliability}}, booktitle = {Proc. IPAC'24}, pages = {}, paper = {THXD1}, venue = {Nashville, TN, USA}, intype = {presented at the}, series = {International Particle Accelerator Conference}, number = {15}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2024}, issn = {2673-5490}, isbn = {978-3-95-450247-9}, note = {presented at IPAC'24, Nashville, TN, USA, May 2024, paper THXD1, unpublished}, language = {english} } @unpublished{guo:napac25-mop060, author = {V. Guo and A. Marinelli and D. Cesar and J. Bloechl and M. Kling and S. OTool}, title = {{Micro-fabricated photoconductive sampling devices for electron beam field measurements}}, booktitle = {Proc. NAPAC'25}, pages = {}, paper = {MOP060}, venue = {Sacramento, California, USA}, intype = {presented at the}, series = {North American Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-7000}, isbn = {978-3-95-450261-5}, note = {presented at NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP060, unpublished}, language = {english} } @inproceedings{k?ñllberg:ibic15-mopb040, author = {A. K?ñllberg and others}, title = {{Instrumentation in DESIREE}}, booktitle = {Proc. IBIC'15}, pages = {131--133}, paper = {MOPB040}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-MOPB040}, url = {https://jacow.org/IBIC2015/papers/MOPB040.pdf}, language = {english} }

References

• F. Ji et al., “Updates on scientific and R&D highlights at SLAC MeV-UED facility”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 1146-1150.
• W. Blokland and M. Schram, “Machine learning for improved accelerator and target reliability”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper THXD1, unpublished.
• V. Guo, A. Marinelli, D. Cesar, J. Bloechl, M. Kling, and S. OTool, “Micro-fabricated photoconductive sampling devices for electron beam field measurements”, presented at the 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, paper MOP060, unpublished.
• A. K?ñllberg et al., “Instrumentation in DESIREE”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 131-133.