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[n]	C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04

[n]	A. Svensson et al., “Application of High Precision RF Measurement for ESS Cavities”, presented at the IPAC'23, Venice, Italy, May 2023, paper TUPA179, unpublished. 

For LaTeX

%\cite{Thiebaux:Cyclotrons19-THB04} \bibitem{Thiebaux:Cyclotrons19-THB04} C. Thiebaux \emph{et al.}, \textquotedblleft{Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}\textquotedblright, in \emph{Proc. Cyclotrons’19}, Cape Town, South Africa, Sep. 2019, pp. 302--304. \doi{10.18429/JACoW-CYCLOTRONS2019-THB04} %\cite{Svensson:IPAC23-TUPA179} \bibitem{Svensson:IPAC23-TUPA179} A. Svensson \emph{et al.}, \textquotedblleft{Application of High Precision RF Measurement for ESS Cavities}\textquotedblright, presented at the IPAC’23, Venice, Italy, May 2023, paper TUPA179, unpublished.

For BibTeX

@inproceedings{thiebaux:cyclotrons19-thb04, author = {C. Thiebaux and others}, title = {{Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}}, booktitle = {Proc. Cyclotrons'19}, pages = {302--304}, paper = {THB04}, venue = {Cape Town, South Africa, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-CYCLOTRONS2019-THB04}, url = {https://jacow.org/cyclotrons2019/papers/THB04.pdf}, language = {english} } @unpublished{svensson:ipac23-tupa179, author = {A. Svensson and others}, title = {{Application of High Precision RF Measurement for ESS Cavities}}, booktitle = {Proc. IPAC'23}, pages = {}, paper = {TUPA179}, venue = {Venice, Italy}, intype = {presented at the}, series = {International Particle Accelerator Conference}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {9}, year = {2023}, issn = {2673-5490}, isbn = {978-3-95-450231-8}, note = {presented at IPAC'23, Venice, Italy, May 2023, paper TUPA179, unpublished}, language = {english} }

References

• C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 302-304.
• A. Svensson et al., “Application of High Precision RF Measurement for ESS Cavities”, presented at the 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUPA179, unpublished.