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[n] R. Pan, T. Lefevre, W. A. Gillespie, and S. P. Jamison, “Synchronization Scheme a Bunch Profile Monitor Based on Electro-Optic Spectral Decoding”, in Proc. BIW'12, Newport News, VA, USA, Apr. 2012, paper MOPG034, pp. 104-106.
[n] G. Ha and N. Majernik, “Generation of sawtooth correlation for bunching factor enhancement”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 380-383. doi:10.18429/JACoW-IPAC2024-MOPG38
[n] D. E. Neben et al., “Fast Sputtering Measurement Studies using Uranium with the NSCL ECR Ion Sources”, in Proc. ECRIS'16, Busan, Korea, Aug.-Sep. 2016, pp. 128-132. doi:10.18429/JACoW-ECRIS2016-WEPP40
[n] G. Ha, “Emittance exchange with periphery cut for high-brightness beam”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 2763-2766. doi:10.18429/JACoW-IPAC2023-WEPA046
[n] E. Schneidmiller et al., “Harmonic Lasing Experiment at the European XFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 29-32. doi:10.18429/JACoW-FEL2019-TUA04
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References
- R. Pan, T. Lefevre, W. A. Gillespie, and S. P. Jamison, “Synchronization Scheme a Bunch Profile Monitor Based on Electro-Optic Spectral Decoding”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG034, pp. 104-106.
- G. Ha and N. Majernik, “Generation of sawtooth correlation for bunching factor enhancement”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPG38, pp. 380-383.
- D. E. Neben et al., “Fast Sputtering Measurement Studies using Uranium with the NSCL ECR Ion Sources”, in Proc. 22nd Int. Workshop on ECR Ion Sources (ECRIS'16), Busan, Korea, Aug.-Sep. 2016, pp. 128-132.
- G. Ha, “Emittance exchange with periphery cut for high-brightness beam”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper WEPA046, pp. 2763-2766.
- E. Schneidmiller et al., “Harmonic Lasing Experiment at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 29-32.
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