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[n]	T. Tanaka et al., “In-Vacuum Undulators”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper TUOC001, pp. 370-377. 

[n]	H. Delsim-Hashemi, “Single Shot Transversal Profile Monitoring of Ultra Low Charge Relativistic Electron Bunches at REGAE”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 257-260. doi:10.18429/JACoW-IBIC2016-MOPG75

For LaTeX

%\cite{Tanaka:FEL05-TUOC001} \bibitem{Tanaka:FEL05-TUOC001} T. Tanaka \emph{et al.}, \textquotedblleft{In-Vacuum Undulators}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper TUOC001, pp. 370--377. %\cite{Delsim-Hashemi:IBIC16-MOPG75} \bibitem{Delsim-Hashemi:IBIC16-MOPG75} H. Delsim-Hashemi, \textquotedblleft{Single Shot Transversal Profile Monitoring of Ultra Low Charge Relativistic Electron Bunches at REGAE}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 257--260. \url{doi:10.18429/JACoW-IBIC2016-MOPG75}

For BibTeX

@inproceedings{tanaka:fel05-tuoc001, author = {T. Tanaka and others}, title = {{In-Vacuum Undulators}}, booktitle = {Proc. FEL'05}, pages = {370--377}, paper = {TUOC001}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/TUOC001.pdf}, language = {english} } @inproceedings{delsim-hashemi:ibic16-mopg75, author = {H. Delsim-Hashemi}, title = {{Single Shot Transversal Profile Monitoring of Ultra Low Charge Relativistic Electron Bunches at REGAE}}, booktitle = {Proc. IBIC'16}, pages = {257--260}, paper = {MOPG75}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-MOPG75}, url = {https://jacow.org/ibic2016/papers/MOPG75.pdf}, language = {english} }

References

• T. Tanaka et al., “In-Vacuum Undulators”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper TUOC001, pp. 370-377.
• H. Delsim-Hashemi, “Single Shot Transversal Profile Monitoring of Ultra Low Charge Relativistic Electron Bunches at REGAE”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 257-260.