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[n] C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844.
[n] L. T. Stant et al., “Diamond-II Electron Beam Position Monitor Development”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 168-172. doi:10.18429/JACoW-IBIC2022-MO3C2
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References
- C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844.
- L. T. Stant et al., “Diamond-II Electron Beam Position Monitor Development”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 168-172.
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