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[n]	C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844. 
[n]	L. T. Stant et al., “Diamond-II Electron Beam Position Monitor Development”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 168-172. doi:10.18429/JACoW-IBIC2022-MO3C2

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