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[n]	A. A. Tishchenko and D. Yu. Sergeeva, “X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 494-497. doi:10.18429/JACoW-IBIC2016-TUPG62

For LaTeX

%\cite{Tishchenko:IBIC16-TUPG62} \bibitem{Tishchenko:IBIC16-TUPG62} A. A. Tishchenko and D. Yu. Sergeeva, \textquotedblleft{X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 494--497. \doi{10.18429/JACoW-IBIC2016-TUPG62}

For BibTeX

@inproceedings{tishchenko:ibic16-tupg62, author = {A. A. Tishchenko and D. Yu. Sergeeva}, title = {{X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy}}, booktitle = {Proc. IBIC'16}, pages = {494--497}, paper = {TUPG62}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-TUPG62}, url = {https://jacow.org/ibic2016/papers/TUPG62.pdf}, language = {english} }

References

• A. A. Tishchenko and D. Yu. Sergeeva, “X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 494-497.