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[n]	P. Craievich and S. Di Mitri, “Emittance Growth due to Short-Range Transverse Wakefields in the FERMI Linac”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper THPP044, pp. XX-XX. 

[n]	V. A. Verzilov and P. E. Dirksen, “OTR Measurements with Sub-MeV Electrons”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 501-503. doi:10.18429/JACoW-IBIC2016-TUPG65

For LaTeX

%\cite{Craievich:FEL05-THPP044} \bibitem{Craievich:FEL05-THPP044} P. Craievich and S. Di Mitri, \textquotedblleft{Emittance Growth due to Short-Range Transverse Wakefields in the FERMI Linac}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper THPP044, pp. XX--XX. %\cite{Verzilov:IBIC16-TUPG65} \bibitem{Verzilov:IBIC16-TUPG65} V. A. Verzilov and P. E. Dirksen, \textquotedblleft{OTR Measurements with Sub-MeV Electrons}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 501--503. \doi{10.18429/JACoW-IBIC2016-TUPG65}

For BibTeX

@inproceedings{craievich:fel05-thpp044, author = {P. Craievich and S. Di Mitri}, title = {{Emittance Growth due to Short-Range Transverse Wakefields in the FERMI Linac}}, booktitle = {Proc. FEL'05}, paper = {THPP044}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/THPP044.pdf}, language = {english} } @inproceedings{verzilov:ibic16-tupg65, author = {V. A. Verzilov and P. E. Dirksen}, title = {{OTR Measurements with Sub-MeV Electrons}}, booktitle = {Proc. IBIC'16}, pages = {501--503}, paper = {TUPG65}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-TUPG65}, url = {https://jacow.org/ibic2016/papers/TUPG65.pdf}, language = {english} }

References

• P. Craievich and S. Di Mitri, “Emittance Growth due to Short-Range Transverse Wakefields in the FERMI Linac”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP044, pp. XX-XX.
• V. A. Verzilov and P. E. Dirksen, “OTR Measurements with Sub-MeV Electrons”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 501-503.