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[n]	J. S. Schmidt et al., “The SIS100 RF Systems - Updates and Recent Progress”, in Proc. IPAC'20, Caen, France, May 2020, pp. 26. doi:10.18429/JACoW-IPAC2020-TUVIR14
[n]	N. Samadi, G. Lovric, C. Ozkan Loch, and X. Shi, “An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 366-369. doi:10.18429/JACoW-IBIC2022-WE1C2

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