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[n] T. T. Arkan et al., “200 MV Record Voltage of vCM and LCLS-II-HE Cryomodules Production Start Fermilab”, in Proc. LINAC'22, Liverpool, UK, Aug.-Sep. 2022, pp. 95-97. doi:10.18429/JACoW-LINAC2022-MOPOPA13
[n] J. M. Mosthaf, T. Fleck, S. Hanke, A. Peters, S. Scheloske, and S. Vollmer, “Overview of the Communication Structure of the HIT Accelerator Control System”, in Proc. PCaPAC'08, Ljbuljana, Slovenia, Oct. 2008, paper WEP002, pp. 168-170.
[n] W. C. Sellyey, J. D. Gilpatrick, and R. Senior, “Bench Test of a Residual Gas Ionization Profile Monitor (RGIPM)”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper TPAH043, pp. 1318-1320.
[n] C. Steier et al., “Intra-Beam Scattering and Minimum Achievable Emittance in the Advanced Light Source”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper RPAH039, pp. 2938-2940.
[n] N. Samadi, G. Lovric, C. Ozkan Loch, and X. Shi, “An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 366-369. doi:10.18429/JACoW-IBIC2022-WE1C2
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References
- T. T. Arkan et al., “200 MV Record Voltage of vCM and LCLS-II-HE Cryomodules Production Start Fermilab”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 95-97.
- J. M. Mosthaf, T. Fleck, S. Hanke, A. Peters, S. Scheloske, and S. Vollmer, “Overview of the Communication Structure of the HIT Accelerator Control System”, in Proc. 7th Int. Workshop on Personal Computers and Particle Accelerator Controls (PCaPAC'08), Ljbuljana, Slovenia, Oct. 2008, paper WEP002, pp. 168-170.
- W. C. Sellyey, J. D. Gilpatrick, and R. Senior, “Bench Test of a Residual Gas Ionization Profile Monitor (RGIPM)”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper TPAH043, pp. 1318-1320.
- C. Steier et al., “Intra-Beam Scattering and Minimum Achievable Emittance in the Advanced Light Source”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper RPAH039, pp. 2938-2940.
- N. Samadi, G. Lovric, C. Ozkan Loch, and X. Shi, “An X-Ray Beam Property Analyzer Based on Dispersive Crystal Diffraction”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 366-369.
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