[n] M. Rei?ƒig et al., “Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 455-459. doi:10.18429/JACoW-IBIC2022-WEP26
%\cite{Rei?ƒig:IBIC22-WEP26} \bibitem{Rei?ƒig:IBIC22-WEP26} M. Rei?ƒig \emph{et al.}, \textquotedblleft{Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee}\textquotedblright, in \emph{Proc. IBIC’22}, Kraków, Poland, Sep. 2022, pp. 455--459. \doi{10.18429/JACoW-IBIC2022-WEP26}
@inproceedings{rei?ƒig:ibic22-wep26, author = {M. Rei?ƒig and others}, title = {{Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee}}, booktitle = {Proc. IBIC'22}, pages = {455--459}, paper = {WEP26}, venue = {Kraków, Poland}, series = {International Beam Instrumentation Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2022}, issn = {2673-5350}, isbn = {978-3-95-450241-7}, doi = {10.18429/JACoW-IBIC2022-WEP26}, language = {english} }
