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[n]	Y. T. Ding and Z. Huang, “SASE FEL Polarization Control Using Crossed Undulator”, in Proc. FEL'08, Gyeongju, Korea, Aug. 2008, paper MOCAU03, pp. 173-176. 

[n]	M. Rei?ƒig et al., “Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 455-459. doi:10.18429/JACoW-IBIC2022-WEP26

For LaTeX

%\cite{Ding:FEL08-MOCAU03} \bibitem{Ding:FEL08-MOCAU03} Y. T. Ding and Z. Huang, \textquotedblleft{SASE FEL Polarization Control Using Crossed Undulator}\textquotedblright, in \emph{Proc. FEL’08}, Gyeongju, Korea, Aug. 2008, paper MOCAU03, pp. 173--176. %\cite{Rei?ƒig:IBIC22-WEP26} \bibitem{Rei?ƒig:IBIC22-WEP26} M. Rei?ƒig \emph{et al.}, \textquotedblleft{Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee}\textquotedblright, in \emph{Proc. IBIC’22}, Kraków, Poland, Sep. 2022, pp. 455--459. \doi{10.18429/JACoW-IBIC2022-WEP26}

For BibTeX

@inproceedings{ding:fel08-mocau03, author = {Y. T. Ding and Z. Huang}, title = {{SASE FEL Polarization Control Using Crossed Undulator}}, booktitle = {Proc. FEL'08}, pages = {173--176}, paper = {MOCAU03}, venue = {Gyeongju, Korea, Aug. 2008}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2008/papers/MOCAU03.pdf}, language = {english} } @inproceedings{rei?ƒig:ibic22-wep26, author = {M. Rei?ƒig and others}, title = {{Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee}}, booktitle = {Proc. IBIC'22}, pages = {455--459}, paper = {WEP26}, venue = {Kraków, Poland}, series = {International Beam Instrumentation Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2022}, issn = {2673-5350}, isbn = {978-3-95-450241-7}, doi = {10.18429/JACoW-IBIC2022-WEP26}, language = {english} }

References

• Y. T. Ding and Z. Huang, “SASE FEL Polarization Control Using Crossed Undulator”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOCAU03, pp. 173-176.
• M. Rei?ƒig et al., “Status of a Monitor Design for Single-Shot Electro-Optical Bunch Profile Measurements at FCC-ee”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 455-459.