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[n]	V. G. Mikhailov et al., “Highly-sensitive Ionization Detectors of Accelerated Beam Parameters for Wide Use”, in Proc. EPAC'94, London, UK, Jun.-Jul. 1994, pp. 1743-1746. 

[n]	V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 104-108. doi:10.18429/JACoW-IBIC2017-MOPWC03

For LaTeX

%\cite{Mikhailov:EPAC94} \bibitem{Mikhailov:EPAC94} V. G. Mikhailov \emph{et al.}, \textquotedblleft{Highly-sensitive Ionization Detectors of Accelerated Beam Parameters for Wide Use}\textquotedblright, in \emph{Proc. EPAC’94}, London, UK, Jun.-Jul. 1994, pp. 1743--1746. %\cite{Schlott:IBIC17-MOPWC03} \bibitem{Schlott:IBIC17-MOPWC03} V. Schlott \emph{et al.}, \textquotedblleft{Commissioning Results and First Operational Experience with SwissFEL Diagnostics}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 104--108. \doi{10.18429/JACoW-IBIC2017-MOPWC03}

For BibTeX

@inproceedings{mikhailov:epac94, author = {V. G. Mikhailov and others}, title = {{Highly-sensitive Ionization Detectors of Accelerated Beam Parameters for Wide Use}}, booktitle = {Proc. EPAC'94}, pages = {1743--1746}, paper = {}, venue = {London, UK, Jun.-Jul. 1994}, series = {European Particle Accelerator Conference}, number = {4}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{schlott:ibic17-mopwc03, author = {V. Schlott and others}, title = {{Commissioning Results and First Operational Experience with SwissFEL Diagnostics}}, booktitle = {Proc. IBIC'17}, pages = {104--108}, paper = {MOPWC03}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-MOPWC03}, url = {https://jacow.org/ibic2017/papers/MOPWC03.pdf}, language = {english} }

References

• V. G. Mikhailov et al., “Highly-sensitive Ionization Detectors of Accelerated Beam Parameters for Wide Use”, in Proc. 4th European Particle Accelerator Conf. (EPAC'94), London, UK, Jun.-Jul. 1994, pp. 1743-1746.
• V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.