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[n]	M. Ruelas, R. B. Agustsson, I. Bacchus, A. Y. Murokh, and R. Tikhoplav, “Commercially Available Transverse Profile Monitors, the IBIS”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper MOP239, pp. 562-564. 
[n]	S. V. Kutsaev, A. Y. Murokh, M. Ruelas, H. L. To, and V. Goncharik, “Single-Shot THz Spectrometer for Bunch Length Measurements”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 782-784. doi:10.18429/JACoW-IBIC2016-WEPG57

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