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[n]	T. Weilbach, K. Aulenbacher, and M. W. Bruker, “Non-Invasive Beam Profile Measurement for High Intensity Electron Beams”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 803-806. doi:10.18429/JACoW-IBIC2016-WEPG67

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