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For Word

[n]	C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, “Stripline Beam Position Monitor for the PAL-XFEL”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 274-277. doi:10.18429/JACoW-IBIC2017-TUPCF26

For LaTeX

%\cite{Kim:IBIC17-TUPCF26} \bibitem{Kim:IBIC17-TUPCF26} C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, \textquotedblleft{Stripline Beam Position Monitor for the PAL-XFEL}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 274--277. \doi{10.18429/JACoW-IBIC2017-TUPCF26}

For BibTeX

@inproceedings{kim:ibic17-tupcf26, author = {C. Kim and J. H. Hong and H.-S. Kang and I. S. Ko and S. J. Lee and D. C. Shin}, title = {{Stripline Beam Position Monitor for the PAL-XFEL}}, booktitle = {Proc. IBIC'17}, pages = {274--277}, paper = {TUPCF26}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-TUPCF26}, url = {https://jacow.org/ibic2017/papers/TUPCF26.pdf}, language = {english} }

References

• C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, “Stripline Beam Position Monitor for the PAL-XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 274-277.