[n] E. Pozdeyev, “Ion Trapping and Cathode Bombardment by Trapped Ions in DC Photoguns”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper TUPMS079, pp. 1356-1358.
[n] C. M. Mateo et al., “Non-interceptive Profile Measurements using an Optical-based Tomography Technique”, in Proc. DIPAC'11, Hamburg, Germany, May 2011, paper TUPD58, pp. 437-439.
Use Complete Form