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[n]	T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217. 

[n]	L. Sabato et al., “RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 404-407. doi:10.18429/JACoW-IBIC2017-WEPCC20

For LaTeX

%\cite{Naito:IBIC12-MOPB63} \bibitem{Naito:IBIC12-MOPB63} T. Naito \emph{et al.}, \textquotedblleft{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215--217. %\cite{Sabato:IBIC17-WEPCC20} \bibitem{Sabato:IBIC17-WEPCC20} L. Sabato \emph{et al.}, \textquotedblleft{RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 404--407. \doi{10.18429/JACoW-IBIC2017-WEPCC20}

For BibTeX

@inproceedings{naito:ibic12-mopb63, author = {T. Naito and others}, title = {{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}}, booktitle = {Proc. IBIC'12}, pages = {215--217}, paper = {MOPB63}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/MOPB63.pdf}, language = {english} } @inproceedings{sabato:ibic17-wepcc20, author = {L. Sabato and others}, title = {{RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC}}, booktitle = {Proc. IBIC'17}, pages = {404--407}, paper = {WEPCC20}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-WEPCC20}, url = {https://jacow.org/ibic2017/papers/WEPCC20.pdf}, language = {english} }

References

• T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.
• L. Sabato et al., “RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 404-407.