[n] C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86.
[n] S. J. Werkema, P. Zhou, and P. L. Colestock, “Trapped Ions and Beam Coherent Instability”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 3303-3306.
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