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[n]	J. S. Wurtele, D. H. Whittum, and X. T. Yu, “Impedance Formalism for an Arbitrary Cumulative Instability”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 3399-3402. 

[n]	N. Y. Na et al., “Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF”, presented at the IBIC'23, Saskatoon, Canada, Sep. 2023, paper WEP037, unpublished. 

For LaTeX

%\cite{Wurtele:PAC93} \bibitem{Wurtele:PAC93} J. S. Wurtele, D. H. Whittum, and X. T. Yu, \textquotedblleft{Impedance Formalism for an Arbitrary Cumulative Instability}\textquotedblright, in \emph{Proc. PAC’93}, Washington D.C., USA, Mar. 1993, pp. 3399--3402. %\cite{Na:IBIC23-WEP037} \bibitem{Na:IBIC23-WEP037} N. Y. Na \emph{et al.}, \textquotedblleft{Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF}\textquotedblright, presented at the IBIC’23, Saskatoon, Canada, Sep. 2023, paper WEP037, unpublished.

For BibTeX

@inproceedings{wurtele:pac93, author = {J. S. Wurtele and D. H. Whittum and X. T. Yu}, title = {{Impedance Formalism for an Arbitrary Cumulative Instability}}, booktitle = {Proc. PAC'93}, pages = {3399--3402}, paper = {}, venue = {Washington D.C., USA, Mar. 1993}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @unpublished{na:ibic23-wep037, author = {N. Y. Na and others}, title = {{Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF}}, booktitle = {Proc. IBIC'23}, pages = {}, paper = {WEP037}, venue = {Saskatoon, Canada}, intype = {presented at the}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, note = {presented at IBIC'23, Saskatoon, Canada, Sep. 2023, paper WEP037, unpublished}, language = {english} }

References

• J. S. Wurtele, D. H. Whittum, and X. T. Yu, “Impedance Formalism for an Arbitrary Cumulative Instability”, in Proc. 15th Particle Accelerator Conf. (PAC'93), Washington D.C., USA, Mar. 1993, pp. 3399-3402.
• N. Y. Na et al., “Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF”, presented at the 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP037, unpublished.