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[n]	J. Galambos, C. K. Allen, W. Blokland, and S. M. Cousineau, “Extracting Information Content within Noisy, Sampled Profile Data from Charged Particle Beams: Part II”, in Proc. LINAC'08, Victoria, Canada, Sep.-Oct. 2008, paper TUP091, pp. 612-614. 

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