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[n]	T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217. 

[n]	S. Chen et al., “Design and Commissioning of the Beam Switchyard for the SXFEL-UF”, in Proc. FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, pp. 91-94. doi:10.18429/JACoW-FLS2023-TU4P08

[n]	Z. P. Liu, H. X. Deng, Z. G. Jiang, X. D. Li, H. J. Qian, and G. Shu, “Design of the Test Platform for High Current VHF Electron Gun”, in Proc. FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, pp. 80-82. doi:10.18429/JACoW-FLS2023-TU4P05

For LaTeX

%\cite{Naito:IBIC12-MOPB63} \bibitem{Naito:IBIC12-MOPB63} T. Naito \emph{et al.}, \textquotedblleft{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215--217. %\cite{Chen:FLS23-TU4P08} \bibitem{Chen:FLS23-TU4P08} S. Chen \emph{et al.}, \textquotedblleft{Design and Commissioning of the Beam Switchyard for the SXFEL-UF}\textquotedblright, in \emph{Proc. FLS’23}, Luzern, Switzerland, Aug.-Sep. 2023, pp. 91--94. \doi{10.18429/JACoW-FLS2023-TU4P08} %\cite{Liu:FLS23-TU4P05} \bibitem{Liu:FLS23-TU4P05} Z. P. Liu, H. X. Deng, Z. G. Jiang, X. D. Li, H. J. Qian, and G. Shu, \textquotedblleft{Design of the Test Platform for High Current VHF Electron Gun}\textquotedblright, in \emph{Proc. FLS’23}, Luzern, Switzerland, Aug.-Sep. 2023, pp. 80--82. \doi{10.18429/JACoW-FLS2023-TU4P05}

For BibTeX

@inproceedings{naito:ibic12-mopb63, author = {T. Naito and others}, title = {{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}}, booktitle = {Proc. IBIC'12}, pages = {215--217}, paper = {MOPB63}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/MOPB63.pdf}, language = {english} } @inproceedings{chen:fls23-tu4p08, author = {S. Chen and others}, title = {{Design and Commissioning of the Beam Switchyard for the SXFEL-UF}}, booktitle = {Proc. FLS'23}, pages = {91--94}, paper = {TU4P08}, venue = {Luzern, Switzerland}, series = {ICFA Advanced Beam Dynamics Workshop}, number = {66}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2024}, issn = {2673-7035}, isbn = {978-3-95-450224-0}, doi = {10.18429/JACoW-FLS2023-TU4P08}, language = {english} } @inproceedings{liu:fls23-tu4p05, author = {Z. P. Liu and H. X. Deng and Z. G. Jiang and X. D. Li and H. J. Qian and G. Shu}, title = {{Design of the Test Platform for High Current VHF Electron Gun}}, booktitle = {Proc. FLS'23}, pages = {80--82}, paper = {TU4P05}, venue = {Luzern, Switzerland}, series = {ICFA Advanced Beam Dynamics Workshop}, number = {66}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2024}, issn = {2673-7035}, isbn = {978-3-95-450224-0}, doi = {10.18429/JACoW-FLS2023-TU4P05}, language = {english} }

References

• T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.
• S. Chen et al., “Design and Commissioning of the Beam Switchyard for the SXFEL-UF”, in Proc. 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper TU4P08, pp. 91-94.
• Z. P. Liu, H. X. Deng, Z. G. Jiang, X. D. Li, H. J. Qian, and G. Shu, “Design of the Test Platform for High Current VHF Electron Gun”, in Proc. 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper TU4P05, pp. 80-82.