Favourites
For Word
[n] T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.
[n] S. Chen et al., “Design and Commissioning of the Beam Switchyard for the SXFEL-UF”, in Proc. FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, pp. 91-94. doi:10.18429/JACoW-FLS2023-TU4P08
For LaTeX
Use Complete Form
For BibTeX
References
- T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.
- S. Chen et al., “Design and Commissioning of the Beam Switchyard for the SXFEL-UF”, in Proc. 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper TU4P08, pp. 91-94.
Back to search