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[n]	L. Y. Yu, J. Chen, Y. B. Leng, K. R. Ye, and W. M. Zhou, “Design of the Beam Profile Monitors for the SXFEL Facility”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPB81, pp. 534-536. 

[n]	C. Davut, Ö. Apsimon, B. L. Militsyn, and S. S. Percival, “Injection Into XFELs, a Review of Trends and Challenges”, in Proc. FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, pp. 99-102. doi:10.18429/JACoW-FLS2023-TU4P12

For LaTeX

%\cite{LYYu:IBIC12-TUPB81} \bibitem{LYYu:IBIC12-TUPB81} L. Y. Yu, J. Chen, Y. B. Leng, K. R. Ye, and W. M. Zhou, \textquotedblleft{Design of the Beam Profile Monitors for the SXFEL Facility}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper TUPB81, pp. 534--536. %\cite{Davut:FLS23-TU4P12} \bibitem{Davut:FLS23-TU4P12} C. Davut, Ö. Apsimon, B. L. Militsyn, and S. S. Percival, \textquotedblleft{Injection Into XFELs, a Review of Trends and Challenges}\textquotedblright, in \emph{Proc. FLS’23}, Luzern, Switzerland, Aug.-Sep. 2023, pp. 99--102. \doi{10.18429/JACoW-FLS2023-TU4P12}

For BibTeX

@inproceedings{lyyu:ibic12-tupb81, author = {L. Y. Yu and J. Chen and Y. B. Leng and K. R. Ye and W. M. Zhou}, title = {{Design of the Beam Profile Monitors for the SXFEL Facility}}, booktitle = {Proc. IBIC'12}, pages = {534--536}, paper = {TUPB81}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/TUPB81.pdf}, language = {english} } @inproceedings{davut:fls23-tu4p12, author = {C. Davut and Ö. Apsimon and B. L. Militsyn and S. S. Percival}, title = {{Injection Into XFELs, a Review of Trends and Challenges}}, booktitle = {Proc. FLS'23}, pages = {99--102}, paper = {TU4P12}, venue = {Luzern, Switzerland}, series = {ICFA Advanced Beam Dynamics Workshop}, number = {66}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2024}, issn = {2673-7035}, isbn = {978-3-95-450224-0}, doi = {10.18429/JACoW-FLS2023-TU4P12}, language = {english} }

References

• L. Y. Yu, J. Chen, Y. B. Leng, K. R. Ye, and W. M. Zhou, “Design of the Beam Profile Monitors for the SXFEL Facility”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPB81, pp. 534-536.
• C. Davut, Ö. Apsimon, B. L. Militsyn, and S. S. Percival, “Injection Into XFELs, a Review of Trends and Challenges”, in Proc. 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper TU4P12, pp. 99-102.