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[n]	L. Y. Yu, J. Chen, Y. B. Leng, K. R. Ye, and W. M. Zhou, “Design of the Beam Profile Monitors for the SXFEL Facility”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPB81, pp. 534-536. 
[n]	C. Davut, Ö. Apsimon, B. L. Militsyn, and S. S. Percival, “Injection Into XFELs, a Review of Trends and Challenges”, in Proc. FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, pp. 99-102. doi:10.18429/JACoW-FLS2023-TU4P12

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