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[n]	R. Kumar and S. J. Vala, “Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source”, presented at the ECRIS'22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished. 

[n]	M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, “Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector”, in Proc. IPAC'25, Taipei, Taiwan, Jun. 2025, pp. 1670-1673. doi:10.18429/JACoW-IPAC2025-WEAN1

[n]	Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, “TOF-SIMS Study of Nitrogen Doping Niobium Samples”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169-173. 

[n]	S. Vrcic and T. Juerges, “Development of the SKA Control System, Progress, and Challenges”, in Proc. ICALEPCS'23, Cape Town, South Africa, Oct. 2023, pp. 1221-1226. doi:10.18429/JACoW-ICALEPCS2023-THMBCMO14

For LaTeX

%\cite{Kumar:ECRIS22-WEP1PG005} \bibitem{Kumar:ECRIS22-WEP1PG005} R. Kumar and S. J. Vala, \textquotedblleft{Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source}\textquotedblright, presented at the ECRIS’22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished. %\cite{Mwaniki:IPAC25-WEAN1} \bibitem{Mwaniki:IPAC25-WEAN1} M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, \textquotedblleft{Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector}\textquotedblright, in \emph{Proc. IPAC’25}, Taipei, Taiwan, Jun. 2025, pp. 1670--1673. \doi{10.18429/JACoW-IPAC2025-WEAN1} %\cite{Yang:SRF15-MOPB036} \bibitem{Yang:SRF15-MOPB036} Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, \textquotedblleft{TOF-SIMS Study of Nitrogen Doping Niobium Samples}\textquotedblright, in \emph{Proc. SRF’15}, Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169--173. %\cite{Vrcic:ICALEPCS23-THMBCMO14} \bibitem{Vrcic:ICALEPCS23-THMBCMO14} S. Vrcic and T. Juerges, \textquotedblleft{Development of the SKA Control System, Progress, and Challenges}\textquotedblright, in \emph{Proc. ICALEPCS’23}, Cape Town, South Africa, Oct. 2023, pp. 1221--1226. \doi{10.18429/JACoW-ICALEPCS2023-THMBCMO14}

For BibTeX

@unpublished{kumar:ecris22-wep1pg005, author = {R. Kumar and S. J. Vala}, title = {{Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source}}, pages = {}, paper = {WEP1PG005}, venue = {Ahmedabad, India, Oct. 2022}, intype = {presented at the}, series = {International Workshop on ECR Ion Sources}, number = {25}, publisher = {JACoW Publishing, Geneva, Switzerland}, note = {presented at ECRIS'22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished}, language = {english} } @inproceedings{mwaniki:ipac25-wean1, author = {M. Mwaniki and R. Ainsworth and P. Snopok and R. Thurman-Keup}, title = {{Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector}}, booktitle = {Proc. IPAC'25}, pages = {1670--1673}, paper = {WEAN1}, venue = {Taipei, Taiwan}, series = {International Particle Accelerator Conference}, number = {16}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2025}, issn = {2673-5490}, isbn = {978-3-95-450248-6}, doi = {10.18429/JACoW-IPAC2025-WEAN1}, language = {english} } @inproceedings{yang:srf15-mopb036, author = {Z. Q. Yang and L. Lin and X. Y. Lu and W. W. Tan and D. Y. Yang and J. Zhao}, title = {{TOF-SIMS Study of Nitrogen Doping Niobium Samples}}, booktitle = {Proc. SRF'15}, pages = {169--173}, paper = {MOPB036}, venue = {Whistler, Canada, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2015/papers/MOPB036.pdf}, language = {english} } @inproceedings{vrcic:icalepcs23-thmbcmo14, author = {S. Vrcic and T. Juerges}, title = {{Development of the SKA Control System, Progress, and Challenges}}, booktitle = {Proc. ICALEPCS'23}, pages = {1221--1226}, paper = {THMBCMO14}, venue = {Cape Town, South Africa}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2226-0358}, isbn = {978-3-95-450238-7}, doi = {10.18429/JACoW-ICALEPCS2023-THMBCMO14}, language = {english} }

References

• R. Kumar and S. J. Vala, “Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source”, presented at the 25th International Workshop on ECR Ion Sources (ECRIS'22), Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished.
• M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, “Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector”, in Proc. 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper WEAN1, pp. 1670-1673.
• Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, “TOF-SIMS Study of Nitrogen Doping Niobium Samples”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169-173.
• S. Vrcic and T. Juerges, “Development of the SKA Control System, Progress, and Challenges”, in Proc. 19th International Conference on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'23), Cape Town, South Africa, Oct. 2023, paper THMBCMO14, pp. 1221-1226.