Reference Search

Favourites

For Word

[n]	J. B. Johnson, “PIN Diode Detectors at DARHT II”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193-1195. 

[n]	S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, “New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper TUPC31, pp. 443-446. 

[n]	E. A. Nissen, J. R. Delayen, and G. A. Krafft, “A Proposed Beam-Beam Test Facility COMBINE”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 3802-3804. doi:10.18429/JACoW-IPAC2021-THPAB025

[n]	K. Koh and R. A. Washington, “Full Scale System Test of Prototype Digitised Waveform System at ISIS”, presented at the ICALEPCS'23, Cape Town, South Africa, Oct. 2023, paper THPDP075, unpublished. 

For LaTeX

%\cite{Johnson:NAPAC13-THPAC24} \bibitem{Johnson:NAPAC13-THPAC24} J. B. Johnson, \textquotedblleft{PIN Diode Detectors at DARHT II}\textquotedblright, in \emph{Proc. NAPAC’13}, Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193--1195. %\cite{Bou Habib:IBIC13-TUPC31} \bibitem{Bou Habib:IBIC13-TUPC31} S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, \textquotedblleft{New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper TUPC31, pp. 443--446. %\cite{Nissen:IPAC21-THPAB025} \bibitem{Nissen:IPAC21-THPAB025} E. A. Nissen, J. R. Delayen, and G. A. Krafft, \textquotedblleft{A Proposed Beam-Beam Test Facility COMBINE}\textquotedblright, in \emph{Proc. IPAC’21}, Campinas, Brazil, May 2021, pp. 3802--3804. \doi{10.18429/JACoW-IPAC2021-THPAB025} %\cite{Koh:ICALEPCS23-THPDP075} \bibitem{Koh:ICALEPCS23-THPDP075} K. Koh and R. A. Washington, \textquotedblleft{Full Scale System Test of Prototype Digitised Waveform System at ISIS}\textquotedblright, presented at the ICALEPCS’23, Cape Town, South Africa, Oct. 2023, paper THPDP075, unpublished.

For BibTeX

@inproceedings{johnson:napac13-thpac24, author = {J. B. Johnson}, title = {{PIN Diode Detectors at DARHT II}}, booktitle = {Proc. NAPAC'13}, pages = {1193--1195}, paper = {THPAC24}, venue = {Pasadena, CA, USA, Sep.-Oct. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/PAC2013/papers/THPAC24.pdf}, language = {english} } @inproceedings{bou habib:ibic13-tupc31, author = {S. Bou Habib and A. Abramowicz and N. Baboi and H. Schlarb}, title = {{New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL}}, booktitle = {Proc. IBIC'13}, pages = {443--446}, paper = {TUPC31}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/TUPC31.pdf}, language = {english} } @inproceedings{nissen:ipac21-thpab025, author = {E. A. Nissen and J. R. Delayen and G. A. Krafft}, title = {{A Proposed Beam-Beam Test Facility COMBINE}}, booktitle = {Proc. IPAC'21}, pages = {3802--3804}, paper = {THPAB025}, venue = {Campinas, Brazil, May 2021}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2021-THPAB025}, url = {https://jacow.org/ipac2021/papers/THPAB025.pdf}, language = {english} } @unpublished{koh:icalepcs23-thpdp075, author = {K. Koh and R. A. Washington}, title = {{Full Scale System Test of Prototype Digitised Waveform System at ISIS}}, booktitle = {Proc. ICALEPCS'23}, pages = {}, paper = {THPDP075}, venue = {Cape Town, South Africa}, intype = {presented at the}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2226-0358}, isbn = {978-3-95-450238-7}, note = {presented at ICALEPCS'23, Cape Town, South Africa, Oct. 2023, paper THPDP075, unpublished}, language = {english} }

References

• J. B. Johnson, “PIN Diode Detectors at DARHT II”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193-1195.
• S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, “New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC31, pp. 443-446.
• E. A. Nissen, J. R. Delayen, and G. A. Krafft, “A Proposed Beam-Beam Test Facility COMBINE”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 3802-3804.
• K. Koh and R. A. Washington, “Full Scale System Test of Prototype Digitised Waveform System at ISIS”, presented at the 19th International Conference on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'23), Cape Town, South Africa, Oct. 2023, paper THPDP075, unpublished.