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[n]	B. K. Shin, M. Chung, G. Hahn, and C. K. Sung, “Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 318-320. doi:10.18429/JACoW-IBIC2023-WE3C02

For LaTeX

%\cite{Shin:IBIC23-WE3C02} \bibitem{Shin:IBIC23-WE3C02} B. K. Shin, M. Chung, G. Hahn, and C. K. Sung, \textquotedblleft{Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing}\textquotedblright, in \emph{Proc. IBIC’23}, Saskatoon, Canada, Sep. 2023, pp. 318--320. \url{doi:10.18429/JACoW-IBIC2023-WE3C02}

For BibTeX

@inproceedings{shin:ibic23-we3c02, author = {B. K. Shin and M. Chung and G. Hahn and C. K. Sung}, title = {{Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing}}, booktitle = {Proc. IBIC'23}, pages = {318--320}, paper = {WE3C02}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, doi = {10.18429/JACoW-IBIC2023-WE3C02}, language = {english} }

References

• B. K. Shin, M. Chung, G. Hahn, and C. K. Sung, “Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WE3C02, pp. 318-320.