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[n]	S. B. Burholt, L. Bobb, and N. Vitoratou, “Performance Evaluation of GAGG+ and Tungsten Carbide Blades in an X-ray Pinhole Camera”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 382-386. doi:10.18429/JACoW-IBIC2023-WEP020

[n]	E. Yamakawa et al., “Study of Single Wire Scanner Monitor for FETS-FFA Test Ring”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 377-381. doi:10.18429/JACoW-IBIC2023-WEP019

[n]	R. M. Thurman-Keup, M. El Baz, and V. E. Scarpine, “A Simulation of the Photoionization of H⁻ Together With the Subsequent Tracking of the Liberated Electrons”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 400-404. doi:10.18429/JACoW-IBIC2023-WEP024

For LaTeX

%\cite{Burholt:IBIC23-WEP020} \bibitem{Burholt:IBIC23-WEP020} S. B. Burholt, L. Bobb, and N. Vitoratou, \textquotedblleft{Performance Evaluation of GAGG+ and Tungsten Carbide Blades in an X-ray Pinhole Camera}\textquotedblright, in \emph{Proc. IBIC’23}, Saskatoon, Canada, Sep. 2023, pp. 382--386. \doi{10.18429/JACoW-IBIC2023-WEP020} %\cite{Yamakawa:IBIC23-WEP019} \bibitem{Yamakawa:IBIC23-WEP019} E. Yamakawa \emph{et al.}, \textquotedblleft{Study of Single Wire Scanner Monitor for FETS-FFA Test Ring}\textquotedblright, in \emph{Proc. IBIC’23}, Saskatoon, Canada, Sep. 2023, pp. 377--381. \doi{10.18429/JACoW-IBIC2023-WEP019} %\cite{Thurman-Keup:IBIC23-WEP024} \bibitem{Thurman-Keup:IBIC23-WEP024} R. M. Thurman-Keup, M. El Baz, and V. E. Scarpine, \textquotedblleft{A Simulation of the Photoionization of H⁻ Together With the Subsequent Tracking of the Liberated Electrons}\textquotedblright, in \emph{Proc. IBIC’23}, Saskatoon, Canada, Sep. 2023, pp. 400--404. \doi{10.18429/JACoW-IBIC2023-WEP024}

For BibTeX

@inproceedings{burholt:ibic23-wep020, author = {S. B. Burholt and L. Bobb and N. Vitoratou}, title = {{Performance Evaluation of GAGG+ and Tungsten Carbide Blades in an X-ray Pinhole Camera}}, booktitle = {Proc. IBIC'23}, pages = {382--386}, paper = {WEP020}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, doi = {10.18429/JACoW-IBIC2023-WEP020}, language = {english} } @inproceedings{yamakawa:ibic23-wep019, author = {E. Yamakawa and others}, title = {{Study of Single Wire Scanner Monitor for FETS-FFA Test Ring}}, booktitle = {Proc. IBIC'23}, pages = {377--381}, paper = {WEP019}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, doi = {10.18429/JACoW-IBIC2023-WEP019}, language = {english} } @inproceedings{thurman-keup:ibic23-wep024, author = {R. M. Thurman-Keup and M. El Baz and V. E. Scarpine}, title = {{A Simulation of the Photoionization of H⁻ Together With the Subsequent Tracking of the Liberated Electrons}}, booktitle = {Proc. IBIC'23}, pages = {400--404}, paper = {WEP024}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, doi = {10.18429/JACoW-IBIC2023-WEP024}, language = {english} }

References

• S. B. Burholt, L. Bobb, and N. Vitoratou, “Performance Evaluation of GAGG+ and Tungsten Carbide Blades in an X-ray Pinhole Camera”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP020, pp. 382-386.
• E. Yamakawa et al., “Study of Single Wire Scanner Monitor for FETS-FFA Test Ring”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP019, pp. 377-381.
• R. M. Thurman-Keup, M. El Baz, and V. E. Scarpine, “A Simulation of the Photoionization of H⁻ Together With the Subsequent Tracking of the Liberated Electrons”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP024, pp. 400-404.