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[n] E. Schneidmiller and M. V. Yurkov, “Background-free Harmonic Production in XFELs via a Reverse Undulator Taper”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 2618-2620. doi:10.18429/JACoW-IPAC2017-WEPAB022
[n] T. Sieber et al., “Measurement of nanoampere beam intensities at FAIR”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 1-7. doi:10.18429/JACoW-IBIC2025-MOBC01
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References
- E. Schneidmiller and M. V. Yurkov, “Background-free Harmonic Production in XFELs via a Reverse Undulator Taper”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 2618-2620.
- T. Sieber et al., “Measurement of nanoampere beam intensities at FAIR”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 1-7.
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