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[n]	Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 746-749. doi:10.18429/JACoW-IBIC2025-WEPMO13

[n]	M. Bree, T. Batten, and W. Javed, “Machine vision cameras for beam spot analysis”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 196-200. doi:10.18429/JACoW-IBIC2025-MOPMO11

For LaTeX

%\cite{Demazeux:IBIC25-WEPMO13} \bibitem{Demazeux:IBIC25-WEPMO13} Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, \textquotedblleft{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 746--749. \doi{10.18429/JACoW-IBIC2025-WEPMO13} %\cite{Bree:IBIC25-MOPMO11} \bibitem{Bree:IBIC25-MOPMO11} M. Bree, T. Batten, and W. Javed, \textquotedblleft{Machine vision cameras for beam spot analysis}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 196--200. \doi{10.18429/JACoW-IBIC2025-MOPMO11}

For BibTeX

@inproceedings{demazeux:ibic25-wepmo13, author = {Q. Demazeux and C. Szwaj and E. Roussel and B. Steffen and M. K. Czwalinna and S. Bielawski}, title = {{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}}, booktitle = {Proc. IBIC'25}, pages = {746--749}, paper = {WEPMO13}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-WEPMO13}, language = {english} } @inproceedings{bree:ibic25-mopmo11, author = {M. Bree and T. Batten and W. Javed}, title = {{Machine vision cameras for beam spot analysis}}, booktitle = {Proc. IBIC'25}, pages = {196--200}, paper = {MOPMO11}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-MOPMO11}, language = {english} }

References

• Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 746-749.
• M. Bree, T. Batten, and W. Javed, “Machine vision cameras for beam spot analysis”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 196-200.