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[n] D. Abell, T. Antonsen, I. Haber, and V. Tembo, “Adjoint Sensitivity Analysis for Design and Optimization”, presented at the IPAC'26, Deauville, France, May 2026, paper WEP5304, unpublished.
[n] M. Lenz, B. Schaap, M. Ota, and P. Musumeci, “Electro-optic sampling based measurement of near field of RF-compressed relativistic electron beams”, presented at the IBIC'25, Liverpool, UK, Sep. 2025, paper WEPCO33, unpublished.
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References
- D. Abell, T. Antonsen, I. Haber, and V. Tembo, “Adjoint Sensitivity Analysis for Design and Optimization”, presented at the 17th Int. Particle Accelerator Conf. (IPAC'26), Deauville, France, May 2026, paper WEP5304, this conference.
- M. Lenz, B. Schaap, M. Ota, and P. Musumeci, “Electro-optic sampling based measurement of near field of RF-compressed relativistic electron beams”, presented at the 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, paper WEPCO33, unpublished.
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