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[n]	Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 746-749. doi:10.18429/JACoW-IBIC2025-WEPMO13

[n]	M. Bree, T. Batten, and W. Javed, “Machine vision cameras for beam spot analysis”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 196-200. doi:10.18429/JACoW-IBIC2025-MOPMO11

[n]	Y. Xiao, Y. Liu, and Y. Leng, “Joint analysis of beam loss and beam position during the injection process at Hefei light source”, in Proc. IBIC'25, Liverpool, UK, Sep. 2025, pp. 215-219. doi:10.18429/JACoW-IBIC2025-MOPMO16

For LaTeX

%\cite{Demazeux:IBIC25-WEPMO13} \bibitem{Demazeux:IBIC25-WEPMO13} Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, \textquotedblleft{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 746--749. \doi{10.18429/JACoW-IBIC2025-WEPMO13} %\cite{Bree:IBIC25-MOPMO11} \bibitem{Bree:IBIC25-MOPMO11} M. Bree, T. Batten, and W. Javed, \textquotedblleft{Machine vision cameras for beam spot analysis}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 196--200. \doi{10.18429/JACoW-IBIC2025-MOPMO11} %\cite{Xiao:IBIC25-MOPMO16} \bibitem{Xiao:IBIC25-MOPMO16} Y. Xiao, Y. Liu, and Y. Leng, \textquotedblleft{Joint analysis of beam loss and beam position during the injection process at Hefei light source}\textquotedblright, in \emph{Proc. IBIC’25}, Liverpool, UK, Sep. 2025, pp. 215--219. \doi{10.18429/JACoW-IBIC2025-MOPMO16}

For BibTeX

@inproceedings{demazeux:ibic25-wepmo13, author = {Q. Demazeux and C. Szwaj and E. Roussel and B. Steffen and M. K. Czwalinna and S. Bielawski}, title = {{Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH}}, booktitle = {Proc. IBIC'25}, pages = {746--749}, paper = {WEPMO13}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-WEPMO13}, language = {english} } @inproceedings{bree:ibic25-mopmo11, author = {M. Bree and T. Batten and W. Javed}, title = {{Machine vision cameras for beam spot analysis}}, booktitle = {Proc. IBIC'25}, pages = {196--200}, paper = {MOPMO11}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-MOPMO11}, language = {english} } @inproceedings{xiao:ibic25-mopmo16, author = {Y. Xiao and Y. Liu and Y. Leng}, title = {{Joint analysis of beam loss and beam position during the injection process at Hefei light source}}, booktitle = {Proc. IBIC'25}, pages = {215--219}, paper = {MOPMO16}, venue = {Liverpool, UK}, series = {Int. Beam Instrum. Conf.}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-5350}, isbn = {978-3-95-450262-2}, doi = {10.18429/JACoW-IBIC2025-MOPMO16}, language = {english} }

References

• Q. Demazeux, C. Szwaj, E. Roussel, B. Steffen, M. K. Czwalinna, and S. Bielawski, “Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 746-749.
• M. Bree, T. Batten, and W. Javed, “Machine vision cameras for beam spot analysis”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 196-200.
• Y. Xiao, Y. Liu, and Y. Leng, “Joint analysis of beam loss and beam position during the injection process at Hefei light source”, in Proc. 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, pp. 215-219.