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[n] R. Klein, P. Budz, K. Buerkmann-Gehrlein, J. Rahn, G. Ulm, and G. Wuestefeld, “The Metrology Light Source: an Electron Storage Ring Dedicated to Metrology”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS019, pp. 3314-3316.
[n] I. Senevirathne, N. Raut, and T. Powers, “Plasma processing of SRF cavities at Jefferson Lab: Experiment results and simulation insight”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 816-820. doi:10.18429/JACoW-NAPAC2025-WEP066
[n] J. M. Schippers and H. H. Kiewiet, “A Beam Profile Monitor Using the Ionization of Residual Gas”, in Proc. Cyclotrons'92, Vancouver, Canada, Jul. 1992, paper IXD-03, pp. 477-478.
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References
- R. Klein, P. Budz, K. Buerkmann-Gehrlein, J. Rahn, G. Ulm, and G. Wuestefeld, “The Metrology Light Source: an Electron Storage Ring Dedicated to Metrology”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPLS019, pp. 3314-3316.
- I. Senevirathne, N. Raut, and T. Powers, “Plasma processing of SRF cavities at Jefferson Lab: Experiment results and simulation insight”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 816-820.
- J. M. Schippers and H. H. Kiewiet, “A Beam Profile Monitor Using the Ionization of Residual Gas”, in Proc. 13th Int. Cyclotron Conf. and Their Applications (Cyclotrons'92), Vancouver, Canada, Jul. 1992, paper IXD-03, pp. 477-478.
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