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[n]	A. Mishin et al., “Standard and microbeam LINATRONs by Varex Imaging Corporation”, presented at the IPAC'26, Deauville, France, May 2026, paper MOP8303, this conference. 

[n]	R. Margraf-O'Neal et al., “Selection of Transverse Diagnostics to measure Few-Micron beam modulations in the Nanopatterned Microbunching Experiment”, presented at the IPAC'26, Deauville, France, May 2026, paper MOP6355, this conference. 

For LaTeX

%\cite{Mishin:IPAC26-MOP8303} \bibitem{Mishin:IPAC26-MOP8303} A. Mishin \emph{et al.}, \textquotedblleft{Standard and microbeam LINATRONs by Varex Imaging Corporation}\textquotedblright, presented at the IPAC’26, Deauville, France, May 2026, paper MOP8303, this conference. %\cite{Margraf-O'Neal:IPAC26-MOP6355} \bibitem{Margraf-O'Neal:IPAC26-MOP6355} R. Margraf-O'Neal \emph{et al.}, \textquotedblleft{Selection of Transverse Diagnostics to measure Few-Micron beam modulations in the Nanopatterned Microbunching Experiment}\textquotedblright, presented at the IPAC’26, Deauville, France, May 2026, paper MOP6355, this conference.

For BibTeX

@conference{mishin:ipac26-mop8303, author = {A. Mishin and others}, title = {{Standard and microbeam LINATRONs by Varex Imaging Corporation}}, pages = {}, paper = {MOP8303}, intype = {presented at the}, series = {International Particle Accelerator Conference}, publisher = {JACoW Publishing, Geneva, Switzerland}, note = {presented at IPAC'26, Deauville, France, May 2026, paper MOP8303, this conference}, language = {english} } @conference{margraf-o'neal:ipac26-mop6355, author = {R. Margraf-O'Neal and others}, title = {{Selection of Transverse Diagnostics to measure Few-Micron beam modulations in the Nanopatterned Microbunching Experiment}}, pages = {}, paper = {MOP6355}, intype = {presented at the}, series = {International Particle Accelerator Conference}, publisher = {JACoW Publishing, Geneva, Switzerland}, note = {presented at IPAC'26, Deauville, France, May 2026, paper MOP6355, this conference}, language = {english} }

References

• A. Mishin et al., “Standard and microbeam LINATRONs by Varex Imaging Corporation”, presented at the 17th Int. Particle Accelerator Conf. (IPAC'26), Deauville, France, May 2026, paper MOP8303, this conference.
• R. Margraf-O'Neal et al., “Selection of Transverse Diagnostics to measure Few-Micron beam modulations in the Nanopatterned Microbunching Experiment”, presented at the 17th Int. Particle Accelerator Conf. (IPAC'26), Deauville, France, May 2026, paper MOP6355, this conference.