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[n]	S. Z. Green et al., “Beam Diagnostic Challenges for FACET-II”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 32-36. doi:10.18429/JACoW-IBIC2017-MO3AB3

[n]	R. Dickson and A. V. Aleksandrov, “A Quest for System User Friendliness with the SNS Ion Beam Bunch Shape Monitor”, in Proc. BIW'12, Newport News, VA, USA, Apr. 2012, paper MOPG036, pp. 110-112. 

For LaTeX

%\cite{Green:IBIC17-MO3AB3} \bibitem{Green:IBIC17-MO3AB3} S. Z. Green \emph{et al.}, \textquotedblleft{Beam Diagnostic Challenges for FACET-II}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 32--36. \doi{10.18429/JACoW-IBIC2017-MO3AB3} %\cite{Dickson:BIW12-MOPG036} \bibitem{Dickson:BIW12-MOPG036} R. Dickson and A. V. Aleksandrov, \textquotedblleft{A Quest for System User Friendliness with the SNS Ion Beam Bunch Shape Monitor}\textquotedblright, in \emph{Proc. BIW’12}, Newport News, VA, USA, Apr. 2012, paper MOPG036, pp. 110--112.

For BibTeX

@inproceedings{green:ibic17-mo3ab3, author = {S. Z. Green and others}, title = {{Beam Diagnostic Challenges for FACET-II}}, booktitle = {Proc. IBIC'17}, pages = {32--36}, paper = {MO3AB3}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-MO3AB3}, url = {https://jacow.org/ibic2017/papers/MO3AB3.pdf}, language = {english} } @inproceedings{dickson:biw12-mopg036, author = {R. Dickson and A. V. Aleksandrov}, title = {{A Quest for System User Friendliness with the SNS Ion Beam Bunch Shape Monitor}}, booktitle = {Proc. BIW'12}, pages = {110--112}, paper = {MOPG036}, venue = {Newport News, VA, USA, Apr. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ BIW2012/papers/MOPG036.pdf}, language = {english} }

References

• S. Z. Green et al., “Beam Diagnostic Challenges for FACET-II”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 32-36.
• R. Dickson and A. V. Aleksandrov, “A Quest for System User Friendliness with the SNS Ion Beam Bunch Shape Monitor”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG036, pp. 110-112.