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[n]	G. M. Ge et al., “Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 2292-2294. doi:10.18429/JACoW-IPAC2016-WEPMR015

[n]	M. F. Stroosnijder and K. Abbas, “Thin Layer Activation for Materials Research Development at IAM of the European Commission”, in Proc. Cyclotrons'98, Caen, France, Jun. 1998, paper A-10, pp. 52-57. 

For LaTeX

%\cite{Ge:IPAC16-WEPMR015} \bibitem{Ge:IPAC16-WEPMR015} G. M. Ge \emph{et al.}, \textquotedblleft{Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica}\textquotedblright, in \emph{Proc. IPAC’16}, Busan, Korea, May 2016, pp. 2292--2294. \doi{10.18429/JACoW-IPAC2016-WEPMR015} %\cite{Stroosnijder:Cyclotrons98-A-10} \bibitem{Stroosnijder:Cyclotrons98-A-10} M. F. Stroosnijder and K. Abbas, \textquotedblleft{Thin Layer Activation for Materials Research Development at IAM of the European Commission}\textquotedblright, in \emph{Proc. Cyclotrons’98}, Caen, France, Jun. 1998, paper A--10, pp. 52--57.

For BibTeX

@inproceedings{ge:ipac16-wepmr015, author = {G. M. Ge and others}, title = {{Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica}}, booktitle = {Proc. IPAC'16}, pages = {2292--2294}, paper = {WEPMR015}, venue = {Busan, Korea}, series = {International Particle Accelerator Conference}, number = {7}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {6}, year = {2016}, doi = {10.18429/JACoW-IPAC2016-WEPMR015}, url = {https://jacow.org/ipac2016/papers/WEPMR015.pdf}, language = {english} } @inproceedings{stroosnijder:cyclotrons98-a-10, author = {M. F. Stroosnijder and K. Abbas}, title = {{Thin Layer Activation for Materials Research Development at IAM of the European Commission}}, booktitle = {Proc. Cyclotrons'98}, pages = {52--57}, paper = {A-10}, venue = {Caen, France, Jun. 1998}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/c98/papers/A-10.pdf}, language = {english} }

References

• G. M. Ge et al., “Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2292-2294.
• M. F. Stroosnijder and K. Abbas, “Thin Layer Activation for Materials Research Development at IAM of the European Commission”, in Proc. 15th Int. Cyclotron Conf. and Their Applications (Cyclotrons'98), Caen, France, Jun. 1998, paper A-10, pp. 52-57.