[n] M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.
[n] P. Forck, C. Andre, F. Becker, D. Hoffmann, and H. Iwase, “Profile Measurement by Beam Induced Fluorescence for 60 MeV/u to 750 MeV/u Heavy Ion Beams”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper TUPCH010, pp. 1013-1015.
Use Complete Form