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[n]	E. Guetlich, O. K. Kester, and P. Forck, “Scintillation Screen Response to Heavy Ion Impact”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPF14, pp. 235-238. 

[n]	K. B. Buerkmann-Gehrlein et al., “Commissioning of the 100 MeV Racetrack Microtron of the Metrology Light Source”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper TUPMN014, pp. 944-946. 

[n]	M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234. 

For LaTeX

%\cite{Guetlich:IBIC13-MOPF14} \bibitem{Guetlich:IBIC13-MOPF14} E. Guetlich, O. K. Kester, and P. Forck, \textquotedblleft{Scintillation Screen Response to Heavy Ion Impact}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper MOPF14, pp. 235--238. %\cite{Buerkmann-Gehrlein:PAC07-TUPMN014} \bibitem{Buerkmann-Gehrlein:PAC07-TUPMN014} K. B. Buerkmann-Gehrlein \emph{et al.}, \textquotedblleft{Commissioning of the 100 MeV Racetrack Microtron of the Metrology Light Source}\textquotedblright, in \emph{Proc. PAC’07}, Albuquerque, NM, USA, Jun. 2007, paper TUPMN014, pp. 944--946. %\cite{Schwickert:IBIC13-MOPF13} \bibitem{Schwickert:IBIC13-MOPF13} M. Schwickert \emph{et al.}, \textquotedblleft{Transverse Beam Profiling for FAIR}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper MOPF13, pp. 232--234.

For BibTeX

@inproceedings{guetlich:ibic13-mopf14, author = {E. Guetlich and O. K. Kester and P. Forck}, title = {{Scintillation Screen Response to Heavy Ion Impact}}, booktitle = {Proc. IBIC'13}, pages = {235--238}, paper = {MOPF14}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/MOPF14.pdf}, language = {english} } @inproceedings{buerkmann-gehrlein:pac07-tupmn014, author = {K. B. Buerkmann-Gehrlein and others}, title = {{Commissioning of the 100 MeV Racetrack Microtron of the Metrology Light Source}}, booktitle = {Proc. PAC'07}, pages = {944--946}, paper = {TUPMN014}, venue = {Albuquerque, NM, USA}, series = {Particle Accelerator Conference}, number = {22}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {8}, year = {2007}, url = {https://jacow.org/p07/papers/TUPMN014.pdf}, language = {english} } @inproceedings{schwickert:ibic13-mopf13, author = {M. Schwickert and others}, title = {{Transverse Beam Profiling for FAIR}}, booktitle = {Proc. IBIC'13}, pages = {232--234}, paper = {MOPF13}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/MOPF13.pdf}, language = {english} }

References

• E. Guetlich, O. K. Kester, and P. Forck, “Scintillation Screen Response to Heavy Ion Impact”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF14, pp. 235-238.
• K. B. Buerkmann-Gehrlein et al., “Commissioning of the 100 MeV Racetrack Microtron of the Metrology Light Source”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper TUPMN014, pp. 944-946.
• M. Schwickert et al., “Transverse Beam Profiling for FAIR”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPF13, pp. 232-234.