[n] A. Sitnikov et al., “Effect of Tin Ion Implantation on the Properties of Amorphous Ge2Sb2Te5 Thin Films”, in Proc. RuPAC'18, Protvino, Russia, Oct. 2018, pp. 230-232. doi:10.18429/JACoW-RUPAC2018-TUPSA41
[n] V. L. Smirnov et al., “Yerevan 120 MeV Linac Test-Facility”, in Proc. LINAC'94, Tsukuba, Japan, Aug. 1994, paper TH-91, pp. 923-925.
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