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[n]	S. Leontein and E. Westlin, “Destructive Beam Profile Monitor Electronics using Gated Current Integrators”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP10E, pp. 1550-1552. 
[n]	V. Kamerdzhiev, G. F. Kuznetsov, G. W. Saewert, and V. D. Shiltsev, “Progress with Electron Beam System for the Tevatron Electron Lenses”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper THPP058, pp. 3500-3502. 
[n]	E. D. Matias et al., “Phase II and III The Next Generation of CLS Beamline Control and Data Acquisition Systems”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper MOPMU013, pp. 454-457. 

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