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[n]	S. Z. Green et al., “Beam Diagnostic Challenges for FACET-II”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 32-36. doi:10.18429/JACoW-IBIC2017-MO3AB3
[n]	R. Dickson and A. V. Aleksandrov, “A Quest for System User Friendliness with the SNS Ion Beam Bunch Shape Monitor”, in Proc. BIW'12, Newport News, VA, USA, Apr. 2012, paper MOPG036, pp. 110-112. 
[n]	V. Kamerdzhiev, G. F. Kuznetsov, G. W. Saewert, and V. D. Shiltsev, “Progress with Electron Beam System for the Tevatron Electron Lenses”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper THPP058, pp. 3500-3502. 

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