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[n]	G. Ciovati, “High Field Q-slope and the Baking Effect”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper TUOAAU01, pp. 88-94. 

[n]	L. Andolfato et al., “Behavioural Models for Device Control”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1109-1115. doi:10.18429/JACoW-ICALEPCS2017-THBPL02

[n]	Y. Ohnishi, “Issues on IR Design at SuperKEKB”, in Proc. eeFACT'16, Daresbury, UK, Oct. 2016, pp. 49-52. doi:10.18429/JACoW-eeFACT2016-TUT1AH1

For LaTeX

%\cite{Ciovati:SRF09-TUOAAU01} \bibitem{Ciovati:SRF09-TUOAAU01} G. Ciovati, \textquotedblleft{High Field Q-slope and the Baking Effect}\textquotedblright, in \emph{Proc. SRF’09}, Berlin, Germany, Sep. 2009, paper TUOAAU01, pp. 88--94. %\cite{Andolfato:ICALEPCS17-THBPL02} \bibitem{Andolfato:ICALEPCS17-THBPL02} L. Andolfato \emph{et al.}, \textquotedblleft{Behavioural Models for Device Control}\textquotedblright, in \emph{Proc. ICALEPCS’17}, Barcelona, Spain, Oct. 2017, pp. 1109--1115. \url{doi:10.18429/JACoW-ICALEPCS2017-THBPL02} %\cite{Ohnishi:eeFACT16-TUT1AH1} \bibitem{Ohnishi:eeFACT16-TUT1AH1} Y. Ohnishi, \textquotedblleft{Issues on IR Design at SuperKEKB}\textquotedblright, in \emph{Proc. eeFACT’16}, Daresbury, UK, Oct. 2016, pp. 49--52. \url{doi:10.18429/JACoW-eeFACT2016-TUT1AH1}

For BibTeX

@inproceedings{ciovati:srf09-tuoaau01, author = {G. Ciovati}, title = {{High Field Q-slope and the Baking Effect}}, booktitle = {Proc. SRF'09}, pages = {88--94}, paper = {TUOAAU01}, venue = {Berlin, Germany, Sep. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2009/papers/TUOAAU01.pdf}, language = {english} } @inproceedings{andolfato:icalepcs17-thbpl02, author = {L. Andolfato and others}, title = {{Behavioural Models for Device Control}}, booktitle = {Proc. ICALEPCS'17}, pages = {1109--1115}, paper = {THBPL02}, venue = {Barcelona, Spain, Oct. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-ICALEPCS2017-THBPL02}, url = {https://jacow.org/icalepcs2017/papers/THBPL02.pdf}, language = {english} } @inproceedings{ohnishi:eefact16-tut1ah1, author = {Y. Ohnishi}, title = {{Issues on IR Design at SuperKEKB}}, booktitle = {Proc. eeFACT'16}, pages = {49--52}, paper = {TUT1AH1}, venue = {Daresbury, UK, Oct. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-eeFACT2016-TUT1AH1}, url = {https://jacow.org/ eefact2016/papers/TUT1AH1.pdf}, language = {english} }

References

• G. Ciovati, “High Field Q-slope and the Baking Effect”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper TUOAAU01, pp. 88-94.
• L. Andolfato et al., “Behavioural Models for Device Control”, in Proc. 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17), Barcelona, Spain, Oct. 2017, pp. 1109-1115.
• Y. Ohnishi, “Issues on IR Design at SuperKEKB”, in Proc. 58th ICFA Advanced Beam Dynamics Workshop on High Luminosity Circular e+e- Colliders (eeFACT'16), Daresbury, UK, Oct. 2016, pp. 49-52.