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[n]	H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, “Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725. doi:10.18429/JACoW-SRF2021-THOTEV07

[n]	B. C. Kuske and J. Bahrdt, “Tolerance Studies for APPLE Undulators in FEL Facilities”, in Proc. FEL'08, Gyeongju, Korea, Aug. 2008, paper TUPPH045, pp. 348-351. 

For LaTeX

%\cite{H.-W:SRF21-THOTEV07} \bibitem{H.-W:SRF21-THOTEV07} H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, \textquotedblleft{Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725. \doi{10.18429/JACoW-SRF2021-THOTEV07} %\cite{Kuske:FEL08-TUPPH045} \bibitem{Kuske:FEL08-TUPPH045} B. C. Kuske and J. Bahrdt, \textquotedblleft{Tolerance Studies for APPLE Undulators in FEL Facilities}\textquotedblright, in \emph{Proc. FEL’08}, Gyeongju, Korea, Aug. 2008, paper TUPPH045, pp. 348--351.

For BibTeX

@inproceedings{h.-w:srf21-thotev07, author = {H.-W. Glock and J. Knobloch and A. Neumann and A. Velez}, title = {{Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities}}, booktitle = {Proc. SRF'21}, pages = {725}, paper = {THOTEV07}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-THOTEV07}, url = {https://jacow.org/srf2021/papers/THOTEV07.pdf}, language = {english} } @inproceedings{kuske:fel08-tupph045, author = {B. C. Kuske and J. Bahrdt}, title = {{Tolerance Studies for APPLE Undulators in FEL Facilities}}, booktitle = {Proc. FEL'08}, pages = {348--351}, paper = {TUPPH045}, venue = {Gyeongju, Korea, Aug. 2008}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2008/papers/TUPPH045.pdf}, language = {english} }

References

• H.-W. Glock, J. Knobloch, A. Neumann, and A. Velez, “Industrial X-Ray Tomographie as a Tool for Shape and Integrity Control of SRF Cavities”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 725.
• B. C. Kuske and J. Bahrdt, “Tolerance Studies for APPLE Undulators in FEL Facilities”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH045, pp. 348-351.